Oxide Capacitance After Full Scaling Formula:
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Oxide Capacitance After Full Scaling refers to the new capacitance value obtained after reducing the dimensions of the MOSFET by applying a full scaling factor. This is an important concept in VLSI design for maintaining proper device characteristics when scaling down transistor sizes.
The calculator uses the scaling formula:
Where:
Explanation: The formula calculates the new oxide capacitance value by multiplying the original oxide capacitance per unit area by the scaling factor applied to the transistor dimensions.
Details: Accurate oxide capacitance calculation is crucial for predicting MOSFET performance after scaling, including threshold voltage, transconductance, and overall device speed in VLSI circuits.
Tips: Enter oxide capacitance per unit area in F/m² and the scaling factor. Both values must be positive numbers greater than zero.
Q1: What is full scaling in VLSI?
A: Full scaling refers to reducing all dimensions of a MOSFET (length, width, oxide thickness) by the same scaling factor to maintain electric field scaling.
Q2: Why does oxide capacitance change with scaling?
A: Oxide capacitance changes because the capacitance per unit area remains constant, but the scaling factor affects the overall capacitance when dimensions are reduced.
Q3: What are typical values for oxide capacitance?
A: Typical values range from 1-10 fF/μm² (1×10⁻¹⁵ to 1×10⁻¹⁴ F/m²) depending on oxide thickness and dielectric constant.
Q4: How does scaling affect MOSFET performance?
A: Proper scaling improves speed, reduces power consumption, and increases integration density while maintaining device reliability.
Q5: What are the limitations of full scaling?
A: Full scaling faces challenges with subthreshold leakage, short-channel effects, and quantum mechanical effects at very small dimensions.